天美传媒

Abstract

Electron microscopy (EM) is a pivotal tool in the characterization of nanomaterials, providing unparalleled insights into their structure, composition, and properties at the nanoscale. This review explores various EM techniques, including scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning tunneling microscopy (STM), highlighting their unique capabilities and applications in nanomaterials analysis. SEM excels in surface morphology imaging, while TEM offers atomic-level resolution for internal structural analysis. Additionally, EDX coupled with EM allows for comprehensive compositional analysis. The review discusses the critical insights gained through these techniques, including the influence of size, shape, and defects on material properties. Despite challenges such as sample preparation and sensitivity to electron radiation, ongoing advancements in EM technology promise to enhance our understanding of nanomaterials, driving innovations across multiple fields.